Title :
The impact of system configuration on device radiation damage testing of optical components
Author :
Kniffan, S.D. ; Reed, R.A. ; Marshall, P.W. ; Howard, J.W. ; Kim, H.S. ; Schepis, J.P.
Keywords :
Assembly; Blades; Cameras; Degradation; Instruments; Light emitting diodes; Optical devices; Protons; System testing; Telescopes;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8
