The impact of system configuration on device radiation damage testing of optical components

Author

Kniffan, S.D. ; Reed, R.A. ; Marshall, P.W. ; Howard, J.W. ; Kim, H.S. ; Schepis, J.P.

fYear

2003

fDate

15-19 Sept. 2003

Firstpage

Lastpage

Keywords

Assembly; Blades; Cameras; Degradation; Instruments; Light emitting diodes; Optical devices; Protons; System testing; Telescopes;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on

Conference_Location

Noordwijk, The Netherlands

ISSN

0379-6566

Print_ISBN

92-9092-846-8

Type

Filename

1442366

Link To Document