Title :
Comparison of single-event transients induced in an operational amplifier (LM124) by pulsed laser light and a broad beam of heavy ions
Author :
Buchner, Stephen ; McMorrow, Dale ; Poivey, Christian ; Howard, James ; Boulghassoul, Y. ; Massengill, Lloyd ; Pease, Ron ; Savage, Mark
Keywords :
Circuit testing; Ion beams; Laser beams; Operational amplifiers; Optical pulse generation; Optical pulses; Pulse amplifiers; Shape; Telephony; Voltage;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8
