436710

Identification of radiation-induced parasitic leakage paths using light emission microscopy

Shaneyfelt, Marty R. ; Tangyunyong, Paiboon ; Hill, Thomas A. ; Soden, Jeny M. ; Flores, Richard S. ; Schwank, James R. ; Dodd, Paul E. ; Hash, Gerald L.

2003

15-19 Sept. 2003

113

117

CMOS technology; Degradation; Integrated circuit technology; Integrated circuit testing; Leakage current; Manufacturing processes; Microscopy; Process design; Radiation hardening; Transistors;

English

ieee

Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on

Noordwijk, The Netherlands

0379-6566

92-9092-846-8

conf

1442410