• DocumentCode
    436711
  • Title

    TID and SEE performance of a commercial 0.13 /spl mu/m CMOS technology

  • Author

    Hänsler, Kurt ; Anelli, Giovanni ; Baldi, Silvia ; Faccio, Federico ; Hajdas, Wojtek ; Marchioro, Alessandro

  • fYear
    2003
  • fDate
    15-19 Sept. 2003
  • Firstpage
    119
  • Lastpage
    125
  • Keywords
    Application specific integrated circuits; CMOS technology; Copper; Integrated circuit technology; MOS devices; Metal-insulator structures; Nuclear power generation; Random access memory; Testing; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
  • Conference_Location
    Noordwijk, The Netherlands
  • ISSN
    0379-6566
  • Print_ISBN
    92-9092-846-8
  • Type

    conf

  • Filename
    1442412
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=436711