TID testing of plastic encapsulated microcircuits with /sup 90/ Sr//sup 90/Y source

Author

Thuesen, Gosta G. ; Jorgensen, John L. ; Guldager, Peter B.

fYear

2003

fDate

15-19 Sept. 2003

Firstpage

127

Lastpage

129

Keywords

Circuit testing; Electron guns; Encapsulation; Instruments; Ionizing radiation; Performance evaluation; Plastics; Production; Strontium; Telephony;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on

Conference_Location

Noordwijk, The Netherlands

ISSN

0379-6566

Print_ISBN

92-9092-846-8

Type

Filename

1442414

Link To Document