Title :
TID testing of plastic encapsulated microcircuits with /sup 90/ Sr//sup 90/Y source
Author :
Thuesen, Gosta G. ; Jorgensen, John L. ; Guldager, Peter B.
Keywords :
Circuit testing; Electron guns; Encapsulation; Instruments; Ionizing radiation; Performance evaluation; Plastics; Production; Strontium; Telephony;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8
