DocumentCode :
436713
Title :
Focused-lon-beam assisted bipolar transistor characterization and analog single-event transient circuit analysis of the OP27
Author :
Rowe, J.D. ; Massengill, L.W. ; Boulghassoul, Y. ; Sternberg, A.L. ; Weller, R.A. ; Buchner, S. ; McMorrow, D. ; Savage, M.W.
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
133
Lastpage :
140
Keywords :
Bipolar transistors; Circuit analysis; Circuit simulation; Circuit testing; Data mining; Ion beams; Operational amplifiers; Packaging; Telephony; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442418
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436713
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