DocumentCode
436713
Title
Focused-lon-beam assisted bipolar transistor characterization and analog single-event transient circuit analysis of the OP27
Author
Rowe, J.D. ; Massengill, L.W. ; Boulghassoul, Y. ; Sternberg, A.L. ; Weller, R.A. ; Buchner, S. ; McMorrow, D. ; Savage, M.W.
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
133
Lastpage
140
Keywords
Bipolar transistors; Circuit analysis; Circuit simulation; Circuit testing; Data mining; Ion beams; Operational amplifiers; Packaging; Telephony; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442418
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