DocumentCode :
436714
Title :
Use of Cf252 isotope facility to unfold SEU cross section in integrated circuits
Author :
Zinchenko, V.F. ; Derevjanko, Y.B. ; Lipsky, A.K.
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
141
Lastpage :
145
Keywords :
Circuit simulation; Circuit testing; Cyclotrons; Integrated circuit modeling; Integrated circuit testing; Ion beams; Isotopes; Laboratories; Life estimation; Space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442419
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436714
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