DocumentCode :
436715
Title :
Failure map functions and accelerated MTTF tests: now approaches for improving the reliability estimation in systems exposed to seus
Author :
Ferreyra, Pablo A. ; Marqués, Carlos A. ; Ferreyra, Ricardo T. ; Gaspar, Javier P.
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
147
Lastpage :
152
Keywords :
Distribution functions; Fault tolerant systems; Histograms; Life estimation; Performance evaluation; Random variables; Real time systems; Single event transient; Single event upset; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442421
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436715
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