DocumentCode :
436722
Title :
Interest of laser test facility for the assessment of natural radiation environment effects on integrated circuits based systems
Author :
Miller, F. ; Germain, A. ; Board, Nesma ; Gaillard, R. ; Poirot, P. ; Chatry, C. ; Carrière, T. ; Dufayel, R.
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
199
Lastpage :
209
Keywords :
Absorption; Aerospace electronics; Aerospace industry; Circuit testing; Integrated circuit testing; Ionization; Optical pulses; Photonic band gap; Silicon; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442435
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436722
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