436723

Validity of using a fixed analog input for evaluating the seu sensitivity of a flash analog-to-digital converter

Buchner, Stephen ; Campbell, Arthur B. ; Stemberg, A. ; McMorrow, Dale ; Massengill, Lloyd ; Dyer, Clive

2003

15-19 Sept. 2003

211

216

Analog-digital conversion; Extraterrestrial measurements; Laboratories; Performance evaluation; Protons; Senior members; Single event upset; System testing; Telephony; Voltage;

English

ieee

Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on

Noordwijk, The Netherlands

0379-6566

92-9092-846-8

conf

1442437