DocumentCode :
436726
Title :
SOI: is it the solution to commercial product SEU sensitivity?
Author :
Haddad, Nadim ; Brown, Ron ; Ferguson, Richard ; Hatfield, Craig ; Rea, David
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
231
Lastpage :
234
Keywords :
CMOS technology; Circuit testing; Materials testing; Medical tests; Microprocessors; Performance evaluation; Protons; Silicon on insulator technology; Single event upset; Space technology;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442442
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436726
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