Title :
Low energy neutron sensitivity of recent generation SRAMs
Author :
Arimani, J.M. ; Simon, G. ; Poirot, P.
Keywords :
Aerospace electronics; CMOS technology; Circuits; Inductors; Neutrons; Random access memory; Single event transient; Single event upset; Testing; Voltage;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8
