• DocumentCode
    436731
  • Title

    Low energy neutron sensitivity of recent generation SRAMs

  • Author

    Arimani, J.M. ; Simon, G. ; Poirot, P.

  • fYear
    2003
  • fDate
    15-19 Sept. 2003
  • Firstpage
    257
  • Lastpage
    262
  • Keywords
    Aerospace electronics; CMOS technology; Circuits; Inductors; Neutrons; Random access memory; Single event transient; Single event upset; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
  • Conference_Location
    Noordwijk, The Netherlands
  • ISSN
    0379-6566
  • Print_ISBN
    92-9092-846-8
  • Type

    conf

  • Filename
    1442449
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=436731