Title :
Single event effects characterization of 16K x 9 fifo
Author :
Marec, Ronan ; Ribeiro, Paul ; Cresciucci, Laetitia ; Barillot, Catherine ; Chatty, C. ; Calvel, Philippe
Keywords :
CMOS process; CMOS technology; Chemical technology; Event detection; Logic devices; Read-write memory; Single event upset; Space technology; Testing; Writing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8
