• DocumentCode
    436734
  • Title

    Comparison of xilinx virtex-II FPGA SEE sensitivities to protons and heavy ions

  • Author

    Koga, R. ; George, J. ; Swift, G. ; Yui, C. ; Edmonds, L. ; Cannichael, C. ; Langley, T. ; Murray, P. ; Lanes, K. ; Napier, M.

  • fYear
    2003
  • fDate
    15-19 Sept. 2003
  • Firstpage
    273
  • Lastpage
    278
  • Abstract
    A comparison of heavy-ion and proton-induced single event effect sensitivities has been made using the Xilinx Virtex-11 field programmable gate array (FPGA). Recently fabricated test samples are selected for observations of single event upset and single event functional interrupt. A complex relationship appears to exist between the heavy ion and proton sensitivities due to effects such as multiplrbit upsets and elastic nuclear scattering.
  • Keywords
    Atomic layer deposition; Equations; Field programmable gate arrays; Ionization; Protons; SRAM chips; Scattering; Silicon; Single event upset; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
  • Conference_Location
    Noordwijk, The Netherlands
  • ISSN
    0379-6566
  • Print_ISBN
    92-9092-846-8
  • Type

    conf

  • Filename
    1442453