DocumentCode
436734
Title
Comparison of xilinx virtex-II FPGA SEE sensitivities to protons and heavy ions
Author
Koga, R. ; George, J. ; Swift, G. ; Yui, C. ; Edmonds, L. ; Cannichael, C. ; Langley, T. ; Murray, P. ; Lanes, K. ; Napier, M.
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
273
Lastpage
278
Abstract
A comparison of heavy-ion and proton-induced single event effect sensitivities has been made using the Xilinx Virtex-11 field programmable gate array (FPGA). Recently fabricated test samples are selected for observations of single event upset and single event functional interrupt. A complex relationship appears to exist between the heavy ion and proton sensitivities due to effects such as multiplrbit upsets and elastic nuclear scattering.
Keywords
Atomic layer deposition; Equations; Field programmable gate arrays; Ionization; Protons; SRAM chips; Scattering; Silicon; Single event upset; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442453
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