Title :
Single event upsets on a read only memory based complex programmable logic device
Author :
Faure, F. ; Velazco, R.
Keywords :
Clocks; Flip-flops; Programmable logic devices; Pulse inverters; Random access memory; Read only memory; Single event transient; Single event upset; Switches; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8
