DocumentCode
436738
Title
Temperature dependence of single-event transient current induced by heavy-ion microbeam on p/sup +//n/n/sup +/ epilayer junctions
Author
Gang Goo ; Hirao, Toshio ; Laird, Jamie Stuart ; Onoda, Shiaobu ; Wakasa, Takeshi ; Yamakawa, Takeshi ; Kamiya, Tomihiro
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
295
Lastpage
299
Keywords
Circuits; Current measurement; Diodes; Plasma temperature; Power system transients; Shape; Space vehicles; Temperature dependence; Temperature distribution; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442458
Link To Document