DocumentCode :
436738
Title :
Temperature dependence of single-event transient current induced by heavy-ion microbeam on p/sup +//n/n/sup +/ epilayer junctions
Author :
Gang Goo ; Hirao, Toshio ; Laird, Jamie Stuart ; Onoda, Shiaobu ; Wakasa, Takeshi ; Yamakawa, Takeshi ; Kamiya, Tomihiro
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
295
Lastpage :
299
Keywords :
Circuits; Current measurement; Diodes; Plasma temperature; Power system transients; Shape; Space vehicles; Temperature dependence; Temperature distribution; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442458
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436738
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