DocumentCode :
436739
Title :
Set risk analyses in digital optocouplers
Author :
Adell, P.C. ; Mion, O. ; Schrimpf, R.D. ; Chatry, C. ; CalveI, P.
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
301
Lastpage :
304
Keywords :
Cyclotrons; Hardware; Light emitting diodes; Mission critical systems; Risk analysis; Satellites; Switches; System testing; Transient response; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442460
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436739
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