• DocumentCode
    436743
  • Title

    System-level design hardening based on worst-case ASET simulations

  • Author

    Boulghassou, Y. ; Adell, Philippe C. ; Rowe, Jason D. ; Massengill, Lloyd W. ; Schrimpf, Ron D. ; Sternberg, Andrew L.

  • fYear
    2003
  • fDate
    15-19 Sept. 2003
  • Firstpage
    327
  • Lastpage
    333
  • Keywords
    Batteries; Circuit simulation; Circuit testing; Consumer electronics; Electronic equipment testing; Operational amplifiers; Pulse amplifiers; Satellites; System testing; System-level design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
  • Conference_Location
    Noordwijk, The Netherlands
  • ISSN
    0379-6566
  • Print_ISBN
    92-9092-846-8
  • Type

    conf

  • Filename
    1442469
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=436743