DocumentCode :
436744
Title :
Mitigation of single-event transients in CMOS digital circuits
Author :
Mongkolkachit, P. ; Bhuva, Bharat ; Boulghassoul, Y. ; Rowe, J. ; Massengill, L.
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
335
Lastpage :
340
Keywords :
CMOS digital integrated circuits; CMOS technology; Clocks; Combinational circuits; Digital circuits; Latches; Pulse circuits; Sampling methods; Voltage; Voting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442471
Link To Document :
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