Title :
Mitigation of single-event transients in CMOS digital circuits
Author :
Mongkolkachit, P. ; Bhuva, Bharat ; Boulghassoul, Y. ; Rowe, J. ; Massengill, L.
Keywords :
CMOS digital integrated circuits; CMOS technology; Clocks; Combinational circuits; Digital circuits; Latches; Pulse circuits; Sampling methods; Voltage; Voting;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8