Title :
The SIRAD irradiation facility for bulk damage and single event effect studies
Author :
Bisello, D. ; Candelori, A. ; Giubilato, P. ; Kaminski, A. ; Pantano, D. ; Rando, R. ; Tessaro, M. ; Wyss, J.
Keywords :
Aerospace electronics; Atomic layer deposition; Electrons; Ionization; Laboratories; Particle measurements; Semiconductor devices; Solar power generation; Space technology; System testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8