DocumentCode
436762
Title
Temperature effects and long term fading of implanted and un-implanted gate oxide RADFETs
Author
Haran, Avner ; Jaksic, Aleksandar ; Refach, N. ; Eliyahu, Avraham ; David, David ; Bar, Joseph
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
465
Lastpage
469
Keywords
Annealing; Fading; Fluctuations; Information retrieval; MOSFETs; Semiconductor device measurement; Temperature dependence; Temperature distribution; Temperature sensors; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442509
Link To Document