• DocumentCode
    436781
  • Title

    Elevated temperature irradiation at high dose rate of commercial linear bipolar ICs

  • Author

    Boch, J. ; Saigne, F. ; Schrimpf, R.D. ; Fleetwood, D.M. ; Cizmarik, R. ; Zander, D.

  • fYear
    2003
  • fDate
    15-19 Sept. 2003
  • Firstpage
    587
  • Lastpage
    592
  • Keywords
    Analog integrated circuits; Bipolar integrated circuits; Bipolar transistors; Degradation; Performance evaluation; Protons; Semiconductor device manufacture; Space charge; Temperature distribution; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
  • Conference_Location
    Noordwijk, The Netherlands
  • ISSN
    0379-6566
  • Print_ISBN
    92-9092-846-8
  • Type

    conf

  • Filename
    1442544
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=436781