Title :
Total dose effect measurement systems for spacecraft and the calibration method
Author :
Kimoto, Yugo ; Koshiishi, Hideki ; Matsumoto, Haruhisa ; Goka, Tateo ; Jaksic, Aleksandar
Keywords :
CMOS technology; Calibration; Circuit testing; Extraterrestrial measurements; Integrated circuit measurements; Satellites; Semiconductor device measurement; Space shuttles; Space stations; Space vehicles;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8
