DocumentCode
436789
Title
MeV neutron-induced SEU in SRAM devices
Author
Flament, O. ; Baggio, J. ; Hose, C.D. ; Gasiot, G. ; Leray, J.L.
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
649
Lastpage
652
Keywords
Analytical models; CMOS technology; Life estimation; Manufacturing; Neutrons; Power measurement; Power supplies; Random access memory; Single event upset; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442565
Link To Document