DocumentCode :
436793
Title :
Enhanced low dose rate sensitivity (ELDRS) observed in RADFET sensor
Author :
Kim, S.J. ; Seon, J. ; Min, K.W. ; Shin, Y.H. ; Choe, W.
fYear :
2003
fDate :
15-19 Sept. 2003
Firstpage :
669
Lastpage :
671
Keywords :
Annealing; Charge carrier processes; Electron traps; MOSFET circuits; Space missions; Telephony; Temperature sensors; Testing; Threshold voltage; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
ISSN :
0379-6566
Print_ISBN :
92-9092-846-8
Type :
conf
Filename :
1442571
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=436793
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