Title :
Charge loss after /sup 60/Co irradiation on flash arrays
Author :
Cellere, G. ; Paccagnella, A. ; Lora, S. ; Pozza, A. ; Tao, G. ; Scarpa, A.
Keywords :
Charge carrier processes; Circuits; Flash memory; Modems; Nonvolatile memory; Radiative recombination; Space technology; Spontaneous emission; Telephony; Threshold voltage;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location :
Noordwijk, The Netherlands
Print_ISBN :
92-9092-846-8