• DocumentCode
    436806
  • Title

    Yield improvement for laser grown on indium phosphide using TBP in the multiwafer planetary reactor

  • Author

    Schmitt, T. ; Deufel, M. ; Schmitz, Darrel

  • Author_Institution
    AIXTRON AG, Aachen, Germany
  • fYear
    2004
  • fDate
    31 May-4 June 2004
  • Firstpage
    153
  • Lastpage
    154
  • Abstract
    The improvement in wafer yield to increase the amount of usable wafer area per epitaxy run is of paramount interest. One possibility would be to change the precursors just for the active layer of the device to combine the advantages of PH3 and TBP in one structure. As TBP is known as already totally decomposed at 600 °C as opposed to the case of PH3 it could give a less temperature sensitive alternative to grow quaternary material for optoelectronic devices. On the other hand buffer and claddings can still be grown with the cheaper PH3. This investigation, focuses on the wafer photoluminescence standard deviation (Std. Div) in a total of 14 laser test structure MOCVD runs. The goal is to check if there could be an advantage to using different precursors in one structure.
  • Keywords
    III-V semiconductors; MOCVD; gallium arsenide; gallium compounds; indium compounds; photoluminescence; semiconductor growth; semiconductor lasers; 600 degC; InGaAsP; InP; MOCVD; PH3; buffer; claddings; indium phosphide; laser; multiwafer planetary reactor; optoelectronic devices; quaternary material; wafer photoluminescence standard deviation; Composite materials; Costs; Indium phosphide; Inductors; Laser transitions; Mass production; Optical materials; Optoelectronic devices; Photoluminescence; Solid state circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 2004. 16th IPRM. 2004 International Conference on
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-8595-0
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2004.1442634
  • Filename
    1442634