DocumentCode
436806
Title
Yield improvement for laser grown on indium phosphide using TBP in the multiwafer planetary reactor
Author
Schmitt, T. ; Deufel, M. ; Schmitz, Darrel
Author_Institution
AIXTRON AG, Aachen, Germany
fYear
2004
fDate
31 May-4 June 2004
Firstpage
153
Lastpage
154
Abstract
The improvement in wafer yield to increase the amount of usable wafer area per epitaxy run is of paramount interest. One possibility would be to change the precursors just for the active layer of the device to combine the advantages of PH3 and TBP in one structure. As TBP is known as already totally decomposed at 600 °C as opposed to the case of PH3 it could give a less temperature sensitive alternative to grow quaternary material for optoelectronic devices. On the other hand buffer and claddings can still be grown with the cheaper PH3. This investigation, focuses on the wafer photoluminescence standard deviation (Std. Div) in a total of 14 laser test structure MOCVD runs. The goal is to check if there could be an advantage to using different precursors in one structure.
Keywords
III-V semiconductors; MOCVD; gallium arsenide; gallium compounds; indium compounds; photoluminescence; semiconductor growth; semiconductor lasers; 600 degC; InGaAsP; InP; MOCVD; PH3; buffer; claddings; indium phosphide; laser; multiwafer planetary reactor; optoelectronic devices; quaternary material; wafer photoluminescence standard deviation; Composite materials; Costs; Indium phosphide; Inductors; Laser transitions; Mass production; Optical materials; Optoelectronic devices; Photoluminescence; Solid state circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 2004. 16th IPRM. 2004 International Conference on
ISSN
1092-8669
Print_ISBN
0-7803-8595-0
Type
conf
DOI
10.1109/ICIPRM.2004.1442634
Filename
1442634
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