DocumentCode
436818
Title
Evolution of cross-sectional structures during selective MBE growth of InGaAs hexagonal nanowire networks on InP [001] and (111)B substrates
Author
Fukushi, Tetsuo ; Muranaka, Tsutomu ; Kimura, Takeshi ; Hasegawa, Hideki
Author_Institution
Res. Center for Integrated Quantum Electron., Hokkaido Univ., Sapporo, Japan
fYear
2004
fDate
31 May-4 June 2004
Firstpage
450
Lastpage
453
Abstract
This paper investigates temporal evolution of cross-sectional structures during the selective MBE growth of hexagonal InGaAs QWR networks. Patterns combining <-110>- and <510>- directions on the [001] substrate and those combining <-1-12>-directions on the (111)B substrate were compared. Pattern formation process and H*-assisted ridge growth were optimized, showing feasibility of hexagonal node densities above 1 × 109 cm-2 with better surface uniformity on (111)B substrates. Cross-sectional structure, wire shape, wire size and their temporal evolution strongly depended on substrate orientation and growth conditions, reflecting complicated kinetic process of growth. Data for precise wire width control have been obtained for both substrate orientations.
Keywords
III-V semiconductors; gallium arsenide; indium compounds; molecular beam epitaxial growth; nanowires; semiconductor growth; semiconductor quantum wires; H*-assisted ridge growth; InGaAs; InP; MBE growth; hexagonal nanowire networks; hexagonal node densities; pattern formation process; surface uniformity; Atomic force microscopy; Hydrogen; Indium compounds; Indium gallium arsenide; Indium phosphide; Lithography; Nanoscale devices; Quantum dots; Scanning electron microscopy; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 2004. 16th IPRM. 2004 International Conference on
ISSN
1092-8669
Print_ISBN
0-7803-8595-0
Type
conf
DOI
10.1109/ICIPRM.2004.1442754
Filename
1442754
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