Title :
Large signal dielectric characterization for integrated electromagnetic power passives
Author :
Liang, Yan ; Chen, Rengang ; van Wyk, J.D.
Author_Institution :
Bradley Dept. of Eletr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
A method of measuring the relative permittivity, hysteresis loop, and loss density of dielectric materials used in integrated electromagnetic power passives is proposed in this paper. This method tests the dielectric capacitors under large signal condition, which resembles in-circuit conditions in power electronics applications. The relative permittivity of the dielectric material and its dependence on electric field strength and temperature are investigated. By analysis of the D-E hysteresis loop, the loss densities of the dielectric materials under different temperatures are also discussed.
Keywords :
dielectric hysteresis; dielectric loss measurement; dielectric materials; electric field measurement; permittivity measurement; power capacitors; power convertors; dielectric capacitors; dielectric materials; electric field strength; hysteresis loop; integrated electromagnetic power; loss density; power electronics; relative permittivity; Density measurement; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Electronic equipment testing; Hysteresis; Loss measurement; Permittivity measurement; Power measurement;
Conference_Titel :
Applied Power Electronics Conference and Exposition, 2005. APEC 2005. Twentieth Annual IEEE
Print_ISBN :
0-7803-8975-1
DOI :
10.1109/APEC.2005.1453108
