• DocumentCode
    437330
  • Title

    Gate bias dependent evolution due to two unintentionally formed quantum dot in a silicon-on-insulator nano-wire transistor

  • Author

    Cho, K.H. ; Son, S.H. ; Kim, H.K. ; Jung, Y.C. ; Naser, B. ; Lin, J.-F. ; Hwang, S.W. ; Ahn, D. ; Bird, J.P. ; Park, B.G.

  • fYear
    2004
  • fDate
    Oct. 27-29, 2004
  • Firstpage
    158
  • Lastpage
    159
  • Keywords
    Capacitance; Electrons; Etching; Fabrication; Quantum computing; Quantum dots; Silicon on insulator technology; Temperature; Transistors; US Department of Transportation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2004. Digest of Papers. 2004 International
  • Print_ISBN
    4-99024720-5
  • Type

    conf

  • DOI
    10.1109/IMNC.2004.245772
  • Filename
    1459522