Sensitivity analysis of stochastic assessment of voltage dips

Author

Leborgne, Roberto C. ; Olguin, G. ; Bollen, Math H J

Author_Institution

Chalmers Univ. of Technol., Goteborg, Sweden

Volume

1

fYear

2004

fDate

21-24 Nov. 2004

Firstpage

69

Abstract

This paper addresses the effect of different uncertainties on the stochastic assessment of voltage dip indices. This task is undertaken by introducing site and system indices and performing sensitivity analysis with regard to some uncertainties. Fault rate, fault-type distribution and fault location uncertainties are addressed in this work. Using a reduced model of the Brazilian power system, site and system indices are calculated for a selected number of buses. Relative variations on system and site indices are calculated in relation to a reference case. Results are presented in tables, graphs and figures.

Keywords

fault location; power supply quality; sensitivity analysis; stochastic processes; Brazilian power system; fault location; fault rate; fault-type distribution; sensitivity analysis; stochastic assessment; voltage dips; Circuit faults; Electronics packaging; Fault location; Power quality; Power system analysis computing; Power system modeling; Sensitivity analysis; Stochastic processes; Uncertainty; Voltage fluctuations;

fLanguage

English

Publisher

ieee

Conference_Titel

Power System Technology, 2004. PowerCon 2004. 2004 International Conference on

Print_ISBN

0-7803-8610-8

Type

conf

DOI

10.1109/ICPST.2004.1459968

Filename

1459968