DocumentCode :
437725
Title :
Four-channel current-mode VLSI shaping amplifier with selectable time constant for high resolution X-ray spectroscopy
Author :
Buzzetti, Siro ; Guazzoni, Chiara ; Longoni, Antonio
Author_Institution :
Dipt. di Elettronica e Informazione, Politecnico di Milano, Milan, Italy
Volume :
1
fYear :
2004
fDate :
16-22 Oct. 2004
Firstpage :
161
Abstract :
A four-channel shaping amplifier for high resolution spectroscopy has been designed and realized in 0.8 μm BiCMOS technology to process the signals coming from a new state of the art silicon drift detector composed by four elements. The 5th-order semi-Gaussian shaping function is obtained by means of a novel current mode topology based on current mirrors to amplify the time constants and on a current feedback technique to obtain complex conjugate poles. The proposed shaper allows the user to choose among four possible gains and two possible shaping-times. The slow shaping time (500 ns) is for best energy resolution measurements while the short one (167 ns) allows high rate measurements. The maximum dynamics for the input signal, coming from any kind of preamplifier, is 400 mV. The output signal can be taken both as a voltage and as a current. We have provided each channel with both a voltage-mode and a current-mode peak stretcher. The four stretched current outputs can be multiplexed on-chip to a single output pin. The noise performances are fully comparable with commercial instruments and the measured linearity is below ±0.5%.
Keywords :
BiCMOS integrated circuits; VLSI; X-ray apparatus; X-ray spectroscopy; current mirrors; drift chambers; energy measurement; nuclear electronics; preamplifiers; silicon radiation detectors; 0.8 mum; 167 ns; 400 mV; 500 ns; 5th-order semiGaussian shaping function; BiCMOS technology; complex conjugate poles; current feedback technique; current mirrors; current mode topology; current-mode peak stretcher; energy resolution measurements; four-channel current-mode VLSI shaping amplifier; high rate measurements; high resolution X-ray spectroscopy; linearity measurement; noise performances; on-chip multiplexing; output signal; preamplifier; selectable time constant; shaper; shaping-times; silicon drift detector; single output pin; stretched current outputs; time constant amplification; voltage-mode peak stretcher; BiCMOS integrated circuits; Energy measurement; Signal design; Signal processing; Signal resolution; Silicon; Spectroscopy; Time measurement; Very large scale integration; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
Type :
conf
DOI :
10.1109/NSSMIC.2004.1462173
Filename :
1462173
Link To Document :
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