Title :
High pressure GEM performance with argon, krypton and xenon gas mixtures
Author :
Altunbas, M.C. ; Barasch, E.F. ; Maier, M.R. ; Bednarek, D. ; Rudin, S. ; Greenwald, A. ; Johnson, E. ; Pralle, M.
Author_Institution :
Dept. of Phys., SUNY, Buffalo, NY, USA
Abstract :
Using a double GEM we were not able to operate with gas gains as high as 1000 in gas mixtures employing CO2, ethane, and propane quenchers at pressures above 2.0 bar in xenon and 3.0 bar in krypton. However, a trinary mixture of Ar/ethane/DME 78.5/20/1.5 allowed stable performance at 8.0 bar (absolute). Exchanging our double GEM for a quadruple GEM then combining this trinary mixture at the 20% level with Kr (Xe) resulted in improved performance with maximum operating pressures of 4.0 bar for Xe and 7.0 bar for Kr mixtures. Importantly, we also added additional heavy quencher by passing the mixed gases over a reservoir containing methylal (TEA).
Keywords :
gas scintillation detectors; particle calorimetry; position sensitive particle detectors; semiconductor counters; 4.0 bar; 7.0 bar; CO2 quencher; Kr mixture; Xe mixture; argon-ethane-DME mixture; double GEM; ethane quencher; gas gains; gas mixtures; heavy quencher; high pressure GEM; methylal; propane quencher; quadruple GEM; Argon; Attenuation; Detectors; Electromagnetic wave absorption; Physics; Resistors; Tungsten; Voltage; X-ray imaging; Xenon;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
DOI :
10.1109/NSSMIC.2004.1462256
