• DocumentCode
    437818
  • Title

    Experience gained in the certification of Seattle MDT ATLAS end-cap chambers

  • Author

    Mockett, Paul M. ; Forbush, David ; Rothberg, Joe ; Twomey, Matthew S.

  • Author_Institution
    Dept. of Phys., Washington Univ., Seattle, WA, USA
  • Volume
    1
  • fYear
    2004
  • fDate
    16-22 Oct. 2004
  • Firstpage
    642
  • Abstract
    ATLAS monitored drift tube (MDT) chambers are composed of precision muon drift tubes assembled into arrays to form base chambers. Each tube wire in a chamber is located to a precision of 25 microns to provide large area precision chambers for the measurement of muons produced in high-energy collisions at the LHC. Following the completion of 80 MDT base chambers we have been through a process at Seattle and CERN of certifying their operational readiness for ATLAS. The certification process involved a recheck of the gas tightness, the addition of the high voltage and signal electronics cards, the cabling, the testing and conditioning for dark current at high voltage and ultimately collecting millions of cosmic ray events for each MDT. This paper reviews the results, the problems and the repairs performed during the certification. Analysis of the cosmic ray events provides an insight into occasional anomalies in tube function.
  • Keywords
    cosmic ray apparatus; drift chambers; muon detection; position sensitive particle detectors; 25 micron; ATLAS monitored drift tube chambers; LHC; Seattle MDT ATLAS end-cap chambers; cabling; cosmic ray events; dark current; gas tightness; high-energy collisions; monitored drift tube base chambers; precision muon drift tubes; signal electronics cards; tube wire; Area measurement; Assembly; Certification; Electronic equipment testing; Large Hadron Collider; Mesons; Monitoring; Signal processing; Voltage; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2004 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8700-7
  • Electronic_ISBN
    1082-3654
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2004.1462275
  • Filename
    1462275