DocumentCode
437834
Title
Spectroscopic performances of DePMOS detector/amplifier device with respect to different filtering techniques and operating conditions
Author
Porro, Matteo ; Ferrari, G. ; Fischer, P. ; Haelker, O. ; Harter, M. ; Herrmann, S. ; Hoernel, N. ; Kohrs, R. ; Lechner, P. ; Lutz, G. ; Peric, I. ; Richten, R.H. ; Strueder, L. ; Treis, J. ; Trimpl, M. ; Wermes, N.
Author_Institution
Dipt. di Ingegneria Nucl., Politecnico di Milano, Milan, Italy
Volume
2
fYear
2004
fDate
16-22 Oct. 2004
Firstpage
724
Abstract
DePMOS structure provides detection and amplification jointly and it is free of interconnection stray capacitance. An electrical model of the device has been provided. The most relevant parameters have been measured in order to choose an adequate readout electronics, to fully exploit the intrinsic low noise of the device. DePMOS can operate in continuous mode, i.e. without applying any clear pulse during the signal processing, and can be read out by a time continuous shaper amplifier. An unequalled noise of 2.2 electrons r.m.s. at room temperature has been measured. In this mode DePMOS can be used e.g. as the readout device for silicon drift detectors. DePMOS was developed to be the basic element of an active pixel sensor suitable to cope with the requirements of XEUS wide field imager. In a matrix arrangement, each pixel must be read out by a time variant filter. A multichannel integrated shaping amplifier, based on multi correlated double sampling, has been designed. Spectroscopic resolution obtained filtering the pixel matrix with this readout chip is in agreement with measurements in continuous mode and matches the predictions of the model presented. It has also been experimentally proved that the clear procedure doesn\´t introduce additional noise contribution, even in the very low noise range achieved. This qualifies DePMOS as a "reset-noise-free" device.
Keywords
MOSFET; amplifiers; nuclear electronics; position sensitive particle detectors; readout electronics; semiconductor counters; semiconductor device noise; time-varying filters; DePMOS amplifier device; DePMOS detector; DePMOS structure; XEUS wide field imager; active pixel sensor; continuous mode; electrical model; filtering techniques; interconnection stray capacitance; intrinsic low noise; matrix arrangement; multichannel integrated shaping amplifier; multicorrelated double sampling; pixel matrix; readout chip; readout device; readout electronics; reset-noise-free device; signal processing; silicon drift detectors; spectroscopic resolution; time continuous shaper amplifier; time variant filter; Capacitance; Detectors; Filtering; Noise measurement; Noise shaping; Pulse amplifiers; Pulse shaping methods; Readout electronics; Spectroscopy; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8700-7
Electronic_ISBN
1082-3654
Type
conf
DOI
10.1109/NSSMIC.2004.1462313
Filename
1462313
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