• DocumentCode
    437842
  • Title

    Effect of γ irradiation on optical components

  • Author

    Baccaro, S. ; Piegari, A. ; Sarcina, D. ; Cecilia, A.

  • Author_Institution
    Adv. Technol. Phys., ENEA, Rome, Italy
  • Volume
    2
  • fYear
    2004
  • fDate
    16-22 Oct. 2004
  • Firstpage
    769
  • Abstract
    Optical components operating in radiation environments, like nuclear facilities, high energy physics and space experiments, are exposed to fluxes of energetic particles, which may deteriorate the image quality. In order to avoid unwanted failure of such components that is due to changes produced in the optical properties of the materials by the hostile conditions, it is useful to perform a preliminary investigation of the radiation induced damage on each type of optical component. In this work, coated optical components are investigated. A set of optical coatings were submitted to γ irradiation at the Calliope 60Co radioisotope source (Research Centre ENEA-Casaccia, Rome) in order to simulate the hostile radiation environment in which they could be employed. The behavior of different substrates, single-layer materials and multilayer optical coatings was investigated by comparing both transmittance and reflectance measurements before and after the γ-ray exposure.
  • Keywords
    gamma-ray effects; optical multilayers; reflectivity; substrates; 60Co radioisotope source; coated optical components; energetic particle fluxes; gamma irradiation; gamma-ray exposure; high energy physics experiments; image quality; multilayer optical coatings; nuclear facilities; optical properties; radiation environments; radiation induced damage; reflectance measurement; single-layer materials; space experiments; substrates; transmittance measurement; Coatings; Instruments; Nonhomogeneous media; Optical devices; Optical materials; Optical sensors; Particle beam optics; Radioactive materials; Reflectivity; Telephony;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2004 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8700-7
  • Electronic_ISBN
    1082-3654
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2004.1462323
  • Filename
    1462323