Title :
Study of neutron pre-irradiated silicon for nuclear detectors
Author :
Litovchenko, P.G. ; Bisello, D. ; Litovchenko, A.P. ; Groza, A.A. ; Dolgolenko, A.P. ; Khivrich, V.I. ; Barabash, L.I. ; Lastovetsky, V.F. ; Polivtsev, L.A. ; Khomenkov, V.P. ; Candelori, A. ; Rando, R. ; Wahl, W. ; Wyss, J. ; Boscardin, M. ; Ronchin, S.
Author_Institution :
Inst. for Nucl. Res., Ukraine
Abstract :
The ways of increasing the radiation hardness of silicon were considered. It was then experimentally shown that a preliminary irradiation of the bulk silicon introduces sinks for radiation defects that leads to an increased radiation hardness of the silicon. Neutron transmutation doping of silicon can be considered as one form of preliminary radiation. It was shown that for neutron transmutated silicon the carrier removal rate in NTD after γ-irradiation is more than one order of magnitude smaller than in a standard reference specimen, but the carriers removal rate after neutron irradiation is approximately a factor of two less.
Keywords :
elemental semiconductors; gamma-ray effects; neutron effects; radiation hardening; semiconductor doping; silicon; bulk silicon; carrier removal rate; gamma-irradiation; neutron irradiation; neutron preirradiated silicon; neutron transmutated silicon; neutron transmutation doping; nuclear detectors; radiation defect sinks; radiation hardness; Annealing; Atomic measurements; Doping; Electromagnetic wave absorption; Infrared spectra; Neutrons; Physics; Radiation detectors; Semiconductor radiation detectors; Silicon;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
DOI :
10.1109/NSSMIC.2004.1462324