Title :
Polyimide-based scintillators studied by ion beam induced luminescence
Author :
Carturan, S. ; Quaranta, A. ; Vomiero, A. ; Bonafini, M. ; Maggioni, G. ; Della Mea, G.
Author_Institution :
Dept. of Phys., Padova Univ., Italy
Abstract :
New organic scintillators for ionizing radiation sensors are synthesized by dispersing dye molecules into chemically imidized polyimide hosts in order to obtain detection systems with improved radiation resistance with respect to the traditional polyvinyltoluene based materials. Nile Red and rhodamine B are dispersed at different concentrations in polyimides derived from the following monomers: 6FDA-DAD, 6FDA-DAB and BPDA-3F. Scintillating thin films are produced by the spin coating technique. Scintillation tests are performed both on pure polyimides and on binary systems by means of ion beam induced luminescence (IBIL), in which the emission spectrum is collected during the irradiation of the films with a 4He+ beam. From the intensity and the degradation rate of the IBIL signal during irradiation, the scintillation efficiency with respect to NE102 and the radiation hardness of the produced films are calculated.
Keywords :
ion beam effects; luminescence; polymer films; solid scintillation detectors; spin coating; 6FDA-DAB monomer; 6FDA-DAD monomer; 4He+ beam irradiation; BPDA-3F monomer; NE102; Nile red; binary systems; chemically imidized polyimide hosts; degradation rate; detection systems; dye molecule dispersion; emission spectrum; ion beam induced luminescence; ionizing radiation sensors; organic scintillators; polyimide-based scintillators; polyvinyltoluene based materials; radiation hardness; radiation resistance; rhodamine B; scintillating thin films; scintillation efficiency; scintillation tests; spin coating technique; Chemical sensors; Ion beams; Ionizing radiation; Ionizing radiation sensors; Luminescence; Organic chemicals; Organic materials; Polyimides; Radiation detectors; Solid scintillation detectors;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
DOI :
10.1109/NSSMIC.2004.1462345