DocumentCode :
437859
Title :
Simulation of signals in ultra radiation-hard silicon pixel detectors
Author :
Lari, T. ; Troncon, C.
Author_Institution :
INFN, Milan, Italy
Volume :
2
fYear :
2004
fDate :
16-22 Oct. 2004
Firstpage :
908
Abstract :
A detailed simulation of silicon pixel detectors irradiated to very high fluences, in the range foreseen for vertex detectors after the Large Hadron Collider luminosity upgrade, is presented. The charge collection properties and the detector response were computed for different silicon materials (standard float zone, diffusion oxygenated float zone, Czochralski, epitaxial silicon) and operating conditions. At the maximum fluence (1016 neqcm-2) the signal is limited by charge trapping rather than by the thickness of the active volume. Since all the silicon materials studied so far have a similar trapping cross section, they are all expected to collect a signal of 2000-2500 electrons at 600 V bias voltage. A detection threshold of 1000-1200 electrons is required in order to have a 97% detection efficiency.
Keywords :
position sensitive particle detectors; radiation hardening (electronics); silicon radiation detectors; 600 V; Czochralski silicon; Large Hadron Collider luminosity upgrade; active volume thickness; bias voltage; charge collection properties; charge trapping; detection efficiency; detection threshold; detector response; diffusion oxygenated float zone silicon; epitaxial silicon; maximum fluence; signal simulation; trapping cross section; ultraradiation-hard silicon pixel detectors; vertex detectors; Computational modeling; Electron traps; Large Hadron Collider; Neutrons; Radiation detectors; Silicon radiation detectors; Space charge; Substrates; Temperature sensors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
Type :
conf
DOI :
10.1109/NSSMIC.2004.1462354
Filename :
1462354
Link To Document :
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