DocumentCode :
437901
Title :
Electron diffusion and scintillation in xenon doped with hydrogen for high-pressure xenon time projection chamber
Author :
Tezuka, C. ; Hasebe, N. ; Kobayashi, S. ; Igarashi, T. ; Mimura, M. ; Hosojima, T. ; Kobayashi, M.-N. ; Doke, T. ; Miyajima, M. ; Miyach, T. ; Okada, H. ; Shibamura, E. ; Pushkin, K.N. ; Ulin, S.E.
Author_Institution :
Adv. Res. Inst. for Sci. & Eng., Waseda Univ., Japan
Volume :
2
fYear :
2004
fDate :
16-22 Oct. 2004
Firstpage :
1157
Abstract :
High-pressure xenon time projection chamber (HPXe-TPC) is a sophisticated detector, which can determine not only an energy of gamma ray but also its arrival direction by using Compton scattering. Diffusion of electrons and scintillation yield in Xe and Xe+H2 mixture have been investigated to realize a HPXe-TPC. The transverse characteristic energy of electrons in Xe-H2 mixture (H2 0.44%) was reduced to about 40% against that of pure Xe at 1.0 MPa. Scintillation yields by alpha-particles (241Am) in Xe+H2 mixture (H2 ∼ 0.23-5.7%) at 2.6 MPa were obtained as a function of E/N. The scintillation yields in Xe+H2 mixture at 2.6 MPa and at E/N = 0.3×10-17 Vcm2 were luminous enough to generate a trigger signal of a HPXe-TPC. It is found that doping hydrogen into xenon is effective to prevent the degradation of angular resolution of a HPXe-TPC.
Keywords :
alpha-particle detection; gamma-ray apparatus; gamma-ray detection; ionisation chambers; scintillation counters; time projection chambers; 1.0 MPa; 2.6 MPa; 241Am; Compton scattering; Xe+H2 mixture; alpha-particle scintillation yields; angular resolution; electron diffusion; gamma ray arrival direction; gamma ray energy; high-pressure xenon time projection chamber; hydrogen-doped xenon; transverse characteristic electron energy; trigger signal; Degradation; Doping; Electrons; Gamma ray detection; Gamma ray detectors; Hydrogen; Scattering; Signal generators; Solid scintillation detectors; Xenon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
Type :
conf
DOI :
10.1109/NSSMIC.2004.1462407
Filename :
1462407
Link To Document :
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