• DocumentCode
    437914
  • Title

    Design and characterization of a novel, radiation-resistant active pixel sensor in a standard 0.25 μm CMOS technology

  • Author

    Villani, Enrico Giulio ; Allport, P.P. ; Casse, G. ; Evans, A. ; Tyndel, M. ; Turchetta, R. ; Velthuis, J.J.

  • Author_Institution
    Rutherford Appleton Lab., Didcot, UK
  • Volume
    2
  • fYear
    2004
  • fDate
    16-22 Oct. 2004
  • Firstpage
    1222
  • Abstract
    CMOS monolithic active pixel sensors are currently developed for particle physics vertex detectors. Their radiation resistance has already been proved to be high enough for the devices to be used at machines like the linear collider, where the radiation fluence is expected to be of the order of 1012 proton/cm2. However, in order to address more radiation-harsh environments, we proposed a novel sensor structure based on the deep N-well, which is found in triple-well CMOS technologies. Potential benefits arising from this technology are investigated and simulation results for standard and novel structure compared.
  • Keywords
    CMOS image sensors; position sensitive particle detectors; semiconductor counters; CMOS monolithic active pixel sensors; deep N-well; linear collider; particle physics vertex detectors; radiation-harsh environments; radiation-resistant active pixel sensor; sensor structure; triple-well CMOS technologies;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2004 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8700-7
  • Electronic_ISBN
    1082-3654
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2004.1462422
  • Filename
    1462422