DocumentCode
437914
Title
Design and characterization of a novel, radiation-resistant active pixel sensor in a standard 0.25 μm CMOS technology
Author
Villani, Enrico Giulio ; Allport, P.P. ; Casse, G. ; Evans, A. ; Tyndel, M. ; Turchetta, R. ; Velthuis, J.J.
Author_Institution
Rutherford Appleton Lab., Didcot, UK
Volume
2
fYear
2004
fDate
16-22 Oct. 2004
Firstpage
1222
Abstract
CMOS monolithic active pixel sensors are currently developed for particle physics vertex detectors. Their radiation resistance has already been proved to be high enough for the devices to be used at machines like the linear collider, where the radiation fluence is expected to be of the order of 1012 proton/cm2. However, in order to address more radiation-harsh environments, we proposed a novel sensor structure based on the deep N-well, which is found in triple-well CMOS technologies. Potential benefits arising from this technology are investigated and simulation results for standard and novel structure compared.
Keywords
CMOS image sensors; position sensitive particle detectors; semiconductor counters; CMOS monolithic active pixel sensors; deep N-well; linear collider; particle physics vertex detectors; radiation-harsh environments; radiation-resistant active pixel sensor; sensor structure; triple-well CMOS technologies;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8700-7
Electronic_ISBN
1082-3654
Type
conf
DOI
10.1109/NSSMIC.2004.1462422
Filename
1462422
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