DocumentCode :
437922
Title :
Characterization of very large silicon avalanche photodiodes
Author :
McClish, Mickel ; Farrell, Richard ; Olschner, Fred ; Squillante, Michael R. ; Entine, Gerald ; Shah, K.S.
Author_Institution :
Radiation Monitoring Devices, Inc., Watertown, MA, USA
Volume :
2
fYear :
2004
fDate :
16-22 Oct. 2004
Firstpage :
1270
Abstract :
In this paper, we discuss recent advances in the high gain, very large area silicon avalanche photodiode technology. Very large area APDs (square and octagonal design, up to 45 cm2 area) have been built using the planar process. These APDs have been successfully operated as scintillation spectrometers. When cooled to -40 °C, the energy resolution of 5.9 keV X-rays (55Fe source) upon direct interaction with the 45 cm2 APD was measured to be 2.4 keV (FWHM). The APD was coupled to a CsI(Tl) scintillator and irradiated with 662 keV gamma rays from 137Cs source and the energy resolution was measured to be ∼10% (FWHM) at the temperature of -40 °C. A rise time of < 2 ns was measured with the 40 cm2 APD upon irradiation with 5.5 MeV alpha particles. A new packaging design has been developed to allow cooling of these large APDs to liquid nitrogen temperature. Evaluation of the 45 cm2 APD has been conducted at LN2 temperatures. Its gain was found to be as high as 104, while the noise was measured to be ∼0.8 electrons (rms). Detection of low intensity optical signal (<8 photons/pulse) with the 45 cm2 APD has also been accomplished.
Keywords :
X-ray apparatus; X-ray detection; alpha-particle detection; avalanche photodiodes; gamma-ray apparatus; gamma-ray detection; particle spectrometers; silicon radiation detectors; solid scintillation detectors; -40 degC; 2.4 keV; 137Cs gamma-ray source; 55Fe X-ray source; CsI(Tl) scintillator; alpha particle irradiation; energy resolution; high gain very large area silicon avalanche photodiode characterization; liquid nitrogen temperature; low intensity optical signal; noise; packaging design; planar process; rise time; scintillation spectrometers; Avalanche photodiodes; Energy measurement; Energy resolution; Gamma rays; Iron; Optical noise; Silicon; Spectroscopy; Temperature; X-rays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN :
1082-3654
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
Type :
conf
DOI :
10.1109/NSSMIC.2004.1462432
Filename :
1462432
Link To Document :
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