Title :
A precise cyclic CMOS time-to-digital converter with low thermal sensitivity
Author :
Chen, Chun-Chi ; Chang, Wei ; Chen, Poki
Author_Institution :
Dept. of Electron. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
Abstract :
In this paper, a precise cyclic CMOS time-to-digital converters (TDC) with low thermal sensitivity is proposed. Through compensation, the thermal sensitivity of the new cyclic time-to-digital converter is reduced dramatically. The proposed TDC possesses not only less thermal-sensitive resolution but also low cost and small chip size. The circuit was fabricated with TSMC 0.35 mum CMOS technology. The size of the circuit is 0.40 mm times 0.30 mm only. The experimental results show that a plusmn6% resolution variation of the new TDC was achieved within 0~100degC temperature range which is much better than plusmn25% of the original uncompensated version. The effective resolution is as fine as 58 ps at room temperature. The measurement rate is 33 kHz, at least.
Keywords :
CMOS integrated circuits; analogue-digital conversion; 0.30 mm; 0.35 mum; 0.40 mm; 33 kHz; 58 ps; chip size; circuit size; effective resolution; measurement rate; precise cyclic CMOS time-digital converter; thermal sensitivity; thermal-sensitive resolution; CMOS technology; Circuits; Delay lines; Energy consumption; Instruments; Laser theory; Power measurement; Semiconductor device measurement; Size measurement; Temperature distribution;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
Conference_Location :
Rome
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
DOI :
10.1109/NSSMIC.2004.1462495