Title :
Particle radiation environments and effects on ESA missions and tools for their analysis
Author :
Santin, Giovanni ; Evans, Hugh D R ; Neiminen, P. ; Daly, Eamonn
Author_Institution :
Space Environ. & Effects Sect., Eur. Space Agency, Noordwijk, Netherlands
Abstract :
The need to assess accurately the effects of high-energy radiation, plasma and micro-particles on space missions has fostered the development and use of new generation tools to cope with the increasingly demanding requirements from more challenging space missions, use of commercial devices and advanced scientific detectors. We present applications at ESA of new tools for the support of space missions including particle transport in planetary magnetic fields, applied to INTEGRAL mission, and shielding assessments in the context of the future BepiColombo and JWST missions. Developments of other new tools or techniques, such as microscopic NIEL degradation prediction tools, will be outlined. The need of a common framework for the development of future analysis tools (Geant4-based and not) is presented. Requirements for future tools for the analysis of radiobiological effects in the context of human exploration initiatives are outlined.
Keywords :
astronomical techniques; astronomy computing; biological effects of radiation; planetary magnetism; radiation effects; radiation protection; shielding; space vehicles; BepiColombo missions; ESA missions; Geant4-based tools; INTEGRAL mission; JWST missions; advanced scientific detectors; high-energy radiation; human exploration initiatives; microparticles; microscopic NIEL degradation prediction tools; particle radiation environments; particle transport; planetary magnetic fields; plasma; radiobiological effects; shielding assessments; space missions; spacecraft; Atmosphere; Atmospheric modeling; Magnetic analysis; Magnetic fields; Microscopy; Plasma applications; Radiation detectors; Radiation effects; Space missions; Space technology;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
Print_ISBN :
0-7803-8700-7
DOI :
10.1109/NSSMIC.2004.1462691