DocumentCode
438174
Title
Role of heat formation on soft magnetic properties and structure of metal-insulator type nano-granular magnetic films
Author
Ohnuma, S. ; Ohnuma, M. ; Hono, K. ; Fujimori, H. ; Masumoto, T.
Author_Institution
The Res. Inst. for Electr. & Magnetic Mater., Japan
fYear
2005
fDate
4-8 April 2005
Firstpage
57
Lastpage
58
Abstract
In this study the magnetic properties and the microstructure of several granular films, which contain the insulating matrix with different magnitude of heat of formation ΔH, were investigated and a guide in obtaining excellent high frequency soft magnetic film was found. Nano-granular films were prepared on glass substrate by Ar+O2 reactive sputtering using Co85ME15 alloy targets (ME: Ge, Sn, Si, Al, Dy, Sm, Y). High resolution transmission electron microscopy and small angle X-ray scattering were used for determination of the film microstructure. Magnetic measurements were conducted on a vibrating sample magnetometer. Results showed that saturation magnetization of Co-ME-O films gradually increased with the magnitude of ΔH of ME-O compound. On the other hand, the electrical resistivity decreased with increasing ΔH of ME-O compound films. These intrinsic factors were attributed to the structure change and segregation of film structure during deposition.
Keywords
X-ray scattering; cobalt compounds; crystal microstructure; electrical resistivity; granular materials; heat of formation; magnetic thin films; magnetisation; nanostructured materials; segregation; soft magnetic materials; transmission electron microscopy; Co85Al15O; Co85Dy15O; Co85Ge15O; Co85Si15O; Co85Sm15O; Co85Sn15O; Co85Y15O; deposition; electrical resistivity; film microstructure; film structure segregation; heat of formation; high frequency soft magnetic film; high resolution transmission electron microscopy; insulating matrix; intrinsic factors; metal-insulator type nano-granular magnetic film structure; reactive sputtering; saturation magnetization; small angle X-ray scattering; structure change; vibrating sample magnetometer; Frequency; Glass; Insulation; Magnetic films; Magnetic properties; Metal-insulator structures; Microstructure; Semiconductor films; Sputtering; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN
0-7803-9009-1
Type
conf
DOI
10.1109/INTMAG.2005.1463457
Filename
1463457
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