DocumentCode
438175
Title
Structural and magnetic anisotropy properties in epitaxial Fe films on Al0.48In0.52As [001]
Author
Tournerie, N. ; Schieffer, P. ; Lepine, B. ; Lallaizon, C. ; Jezequel, G.
Author_Institution
Equipe de Physique des Surfaces et Interfaces, Rennes I Univ., France
fYear
2005
fDate
4-8 April 2005
Firstpage
67
Lastpage
68
Abstract
Study on the structural and magnetic anisotropy properties of Fe thin films deposited on the Al0.48In0.52As layer lattice-matched on InP(001) substrate is reported. The mismatch in lattice parameters ((aInP-2aFe)/aInP) is 2.2% while for Fe/GaAs(001) the misfit is -1.4%. The structural analysis are performed using X-ray diffraction (XRD) and reflection high-energy electron diffraction (RHEED) and the anisotropy constants are deduced from magneto-optic Kerr effect (MOKE) measurements. The epitaxy of the Fe layers on the Al0.48In0.52As(001) surface is demonstrated. Results reveal that Fe/Al0.48In0.52As(001) qualitatively the same magnetic behaviour as the Fe/GaAs(001) system. This concerns in particular (for the lowest coverage < 2 nm) the large interfacial uniaxial magnetic anisotropy (UMA) with the easy axis along the [110] substrate direction.
Keywords
Kerr magneto-optical effect; X-ray diffraction; ferromagnetic materials; iron; magnetic anisotropy; magnetic epitaxial layers; metallic epitaxial layers; reflection high energy electron diffraction; Al0.48In0.52As; Fe; X-ray diffraction; epitaxial films; lattice parameters; magnetic anisotropy; magneto-optic Kerr effect; misfit; mismatch; reflection high-energy electron diffraction; structural analysis; Indium phosphide; Iron; Lattices; Magnetic analysis; Magnetic anisotropy; Magnetic films; Magnetic properties; Sputtering; Substrates; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
Print_ISBN
0-7803-9009-1
Type
conf
DOI
10.1109/INTMAG.2005.1463462
Filename
1463462
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