• DocumentCode
    438193
  • Title

    Lorentz microscopy studies of domain wall trap structures

  • Author

    McVitie, S. ; Brownlie, C. ; Chapman, J.N. ; Wilkinson, C.D.W.

  • Author_Institution
    Dept. of Phys. & Astron., Glasgow Univ., UK
  • fYear
    2005
  • fDate
    4-8 April 2005
  • Firstpage
    195
  • Lastpage
    196
  • Abstract
    Initial results on domain wall trap structures fabricated by electron beam lithography are described based on those proposed by micromagnetic simulations. The trap structures are made from thermally evaporated permalloy (Ni81Fe19) with thickness of 20 nm. Characterisation of the magnetic behaviour of the structures is carried out using the Fresnel mode of Lorentz microscopy as practised in a transmission electron microscope.
  • Keywords
    Permalloy; electron beam lithography; magnetic domain walls; magnetic thin films; micromagnetics; transmission electron microscopy; 20 nm; Fresnel mode; Lorentz microscopy; Ni81Fe19; domain wall trap structures; electron beam lithography; magnetic behaviour; micromagnetic simulations; thermally evaporated permalloy; transmission electron microscope; Geometry; Magnetic anisotropy; Magnetic domain walls; Magnetic domains; Magnetic heads; Perpendicular magnetic anisotropy; Proposals; Saturation magnetization; Strips; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2005. INTERMAG Asia 2005. Digests of the IEEE International
  • Print_ISBN
    0-7803-9009-1
  • Type

    conf

  • DOI
    10.1109/INTMAG.2005.1463526
  • Filename
    1463526
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=438193