Title :
Theoretic analysis and enhanced x-tolerance of test response compact based on convolutional code
Author :
Han, Yinhe ; Hu, Yu ; Li, Huawei ; Li, Xiaowei
Author_Institution :
Inst. of Comput. Technol., Chinese Acad. of Sci., Beijing, China
Abstract :
This paper addresses the problem of test response compaction. In order to maximize compaction ratio, a single-output encoder based on check matrix of a (n, n-1, m, 3) convolutional code is proposed. Theoretic analysis for this encoder is presented to avoid two and any odd erroneous bit cancellations, handle one unknown bit (X bit) and diagnose one erroneous bit. The X-bits tolerance capacity can be enhanced by choosing a proper memory size and weight of check matrix, which can also be obtained by an optimized input assignment algorithm. The theoretic analysis and experimental results on aliasing shows the efficiency of the proposed encoder.
Keywords :
convolutional codes; digital circuits; integrated circuit testing; logic testing; X-bits tolerance capacity; bit cancellations; check matrix; compaction ratio; convolutional code; memory size; single-output encoder; test response compaction; x-tolerance enhancement; Block codes; Buffer storage; Circuit testing; Compaction; Computers; Convolutional codes; Costs; Error correction codes; Pins; System testing;
Conference_Titel :
Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific
Print_ISBN :
0-7803-8736-8
DOI :
10.1109/ASPDAC.2005.1466129