DocumentCode :
438429
Title :
An efficient control-oriented coverage metric
Author :
Verma, Shireesh ; Ramineni, K. ; Harris, Ian G.
Author_Institution :
Center for Embedded Comput. Syst., California Univ., Irvine, CA, USA
Volume :
1
fYear :
2005
fDate :
18-21 Jan. 2005
Firstpage :
317
Abstract :
Coverage metrics, which evaluate the ability of a test sequence to detect design faults, are essential to the validation process. A key source of difficulty in determining fault detection is that the control flow path traversed in the presence of a fault cannot be determined. Fault detection can only be accurately determined by exploring the set of all control flow paths, which may be traversed as a result of a fault. We present a coverage metric that determines the propagation of fault effects along all possible faulty control flow paths. The complexity of exploring multiple control flow paths is greatly alleviated by heuristically pruning infeasible control flow paths using the algorithm that we present. The proposed coverage metric provides high accuracy in designs that contain complex control flow. The results obtained are promising.
Keywords :
fault diagnosis; integrated circuit testing; logic testing; control flow path; control-oriented coverage metric; design fault detection; test sequence; validation process; Circuit faults; Computational complexity; Embedded computing; Error correction; Fault detection; Petroleum; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific
Print_ISBN :
0-7803-8736-8
Type :
conf
DOI :
10.1109/ASPDAC.2005.1466181
Filename :
1466181
Link To Document :
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