Title :
Three-dimensional image reconstruction for JPET-D4 using suitable histogramming method to DOI detector
Author :
Hagiwara, Naoki ; Obi, Takashi ; Yamaya, Taiga ; Yamaguchi, Masahiro ; Ohyama, Nagaaki ; Kitamura, Keishi ; Haneishi, Hideaki ; Yoshida, Eiji ; Inadama, Naoko ; Murayama, Hideo
Author_Institution :
Tokyo Inst. of Technol., Yokohama, Japan
Abstract :
The next generation PET scanner named JPET-D4 has been developed at the National Institute of Radiological Sciences (NIRS) in Japan. The JPET-D4 has 4 layers DOI detectors and its data size becomes huge to handling. Then at first stage, we plan to apply the reconstruction techniques after the histogramming of list-mode data because it is easy to implement and effective to decrease computational cost The conventional histogramming technique is inapplicable to 4 layers DOI detectors, so we proposed the new histogramming method which is suitable for the multi-layer DOI detector. In this method, DOI-PET list-mode data is transformed into sinogram with an accurate system model of the crystal block. In this paper, we implemented this method with a full three dimensional system model. And we also applied the method to experimental data with prototype system for the JPET-D4 scanner. Experimental results show that the proposed method keeping the advantage of DOI information, and the image quality of the JPET-D4 is superior to a conventional NonDOI PET scanner.
Keywords :
brain; image reconstruction; image scanners; list processing; medical image processing; positron emission tomography; JPET-D4 scanner; National Institute of Radiological Sciences; PET scanner; brain; computational cost; histogramming method; image quality; list-mode data; multilayer depth-of-interaction detector; sinogram; three-dimensional image reconstruction; Computational efficiency; Crystals; Detectors; Image quality; Image reconstruction; Positron emission tomography; Probability distribution; Prototypes; Sensor arrays; Spatial resolution;
Conference_Titel :
Nuclear Science Symposium Conference Record, 2004 IEEE
Print_ISBN :
0-7803-8700-7
Electronic_ISBN :
1082-3654
DOI :
10.1109/NSSMIC.2004.1466713